1. metric CMOS VLSI circuits-oriented testing for nano-Defect

المکتبة: كتابخانه مركزي و مركز اسناد دانشگاه مازندران (مازندران)

موضوع: Integrated circuits ; Very large scale integration ; Defects. ; Integrated circuits ; Very large scale integration ; Testing. ; Metal oxide semiconductors, Complementary ; Defects. ; Metal oxide semiconductors, Complementary ; Testing. ;